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FEATURED PRODUCTS

Particle Surface Area & Porosity Analyzers

Surface area and porosity are two important physical properties that determine the quality and utility of many materials, and Micromeritics offers a product to fulfill almost any need for surface area and porosity determination. 

Amazon filter bags are designed to withstand 70- to 100-psi bursts of compressed air in the cleaning cycle
Based on XDS near-infrared Technology, the FOSS XDS Process Analytics™ Microbundle Multiplexer provides the next generation of process analysis for real-time process analysis in the pharmaceutical and chemical industries. Non-destructive, accurate measurements are performed directly in the process line, blender, dryer, or reactor.
Alfa Laval offers an eight-page, full-color brochure explaining its pretesting methods for improving process performance before equipment decisions are made

Nominal Rated Melt Blown Depth Cartridges

Marken has trained professionals with global expertise to protect and manage the logistics of medical devices, diagnostic equipment, and medical components including sensitive microchips and surgical equipment with expertise in ECG/ABM devices, stents, pace makers, and investigator site specimen separation devices.

CHEM SHOW ’99: A cold jacketed Wet Electrostatic Precipitator, Condensing WESP, incorporates a prescrubbing section to eliminate odor, while an associated cooling tower continuously cools the scrubbing liquid to maintain odor control at the highest level of performance.

Endress+Hauser offers continuous level measurement and point level detection in liquids and bulk solids

10 Litres/Min is delivered from the new Peak Scientific hydrogen generator. The system is also capable of pressures...

SPECIAL FEATURE

Tackle Your Toughest Interface Challenges

Reliable interface level measurement keeps production flowing. If liquids are not separated effectively, you face processing problems, equipment failures, production loss, fines and shutdown. That's why Magnetrol® matters. Our technologies are proven to accurately measure total level and interface layers. Because when it comes to interface, level matters. Learn more.